A Comparative Study of Three Random Password Generators
Authors: Michael D. Leonhard, V. N. Venkatakrishnan

Date: May 2007
Publication: Proceedings of the IEEE Electro/Information Technology Conference (EIT) 2007
Publisher: IEEE
Source 1: http://tamale.net/pub/2007/pwdgen/pwdgen.pdf

Abstract or Summary:
This paper compares three random password generation schemes, describing and analyzing each. It also reports the results of a small study testing the quality of the passwords generated by the schemes. Qualities discussed include security, memorability, and user affinity. Improvements to the schemes and experiment are suggested.

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